2008 Journal Papers
S. J. C. Irvine, V. Barrioz, D. Lamb, E. W. Jones and R. L. Rowlands-Jones, MOCVD of thin film photovoltaic solar cells - Next generation production technology, J. Crystal Growth 310 (2008) 5198-5203
J. E. Hails, S. J. C. Irvine, D. J. Cole-Hamilton, J. Giess, M. R. Houlton and A. Graham, As doping in (Hg, Cd)Te: an alternative point of view, J of Electronic Materials, 37 (2008) 1291-1302
R. L. Rowlands, S. J. C. Irvine, V. Barrioz, E. W. Jones and D. A. Lamb, SIMS analysis of intentional in situ arsenic doping in CdS/CdTe solar cells, J Semiconductor Science and Technology 23 (2008) 015017
T. Markvart, Solar cell as a heat engine: energy-entropy analysis of photovoltaic energy conversion, Phys. Stat. Sol. (a) 205, 2752 (2008)
D.M.Bagnall and M. Boreland, Photovoltaic technologies, Energy Policy, 36 (2008) 4390
S.A. Boden and D.M. Bagnall "Tunable reflection minima of nanostructured antireflective surfaces" APPLIED PHYSICS LETTERS, 93 (2008) 133108
S.A. Boden and D.M. Bagnall "Sunrise to Sunset Optimization of Thin Film Antireflective Coatings for Encapsulated,Planar Silicon Solar Cells". PROGRESS IN PHOTOVOLTAICS: RESEARCH AND APPLICATIONS, 17 (2009) 241
F O Lucas, A Mitra, P J McNally, L O'Reilly, S Daniels, G Natarajan, K Durose , Y Y Proskuryakov, D C Cameron, Morphological, optical and electrical properties of gamma CuCl deposited by vacuum evaporation. Journal of Materials Science - Materials in Electronics 19 (2) 99-101 2008
J.M. Scragg, P.J. Dale and L.M. Peter, G. Zoppi and I. Forbes. New routes to sustainable photovoltaics: evaluation of Cu2ZnSnS4 as an alternative absorber material, Physica Status Solidi (a).245 1772-8 (2008).
P.J. Dale, A.P Samantilleke, G. Zoppi, I. Forbes and L.M. Peter, Characterization of CuInSe2 material and devices: comparison of thermal and electrochemically absorber layers, J. Phys. D: Appl. Phys. 41, 085105 8 pp. (2008).
J.J. Scragg, P.J. Dale, L.M. Peter, Towards sustainable materials for solar energy conversion: Preparation and photoelectrochemical characterization of Cu2ZnS4, Electrochemistry Communications 10. 639-642 (2008).
S. Roncallo, J.D. Painter, M.A. Cousins, D.W. Lane, K.D. Rogers, A method to quantify the degree of uniformity of thickness of thin films, Thin Solid Films 516 (2008) 8493-849